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Electron -Beam- Specimen Interactions and Simulations Mthods in Microscopy

MENDIS, B. G.

Electron -Beam- Specimen Interactions and Simulations Mthods in Microscopy - Hoboken, John Wiley &son, Inc, 2018. - x, 279p.: Ill.;figures & pictures. Index 23cm.

ISBN: 978-1-118-45609-5

Dewey Class. No.: 541.092 MEN

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