MENDIS,  B. G. <br/><br/>
Electron -Beam- Specimen  Interactions and  Simulations  Mthods  in Microscopy 

 - Hoboken,  John Wiley &son, Inc,  2018. 
 - x, 279p.: Ill.;figures & pictures.  Index  23cm. 
<br/><br/><label>ISBN: </label>978-1-118-45609-5 
<br/><br/><label>Dewey Class. No.: </label>541.092 MEN