TY  - GEN
AU  - MENDIS,  B. G.
TI  - Electron -Beam- Specimen  Interactions and  Simulations  Mthods  in Microscopy
SN  - 978-1-118-45609-5
U1  - 541.092 MEN 
PY  - 2018///
CY  - Hoboken
PB  - John Wiley &son, Inc
ER  -