000 00415 a2200133 4500
005 20250619121821.0
020 _a978-1-118-45609-5
082 _a541.092 MEN
100 _aMENDIS, B. G.
245 _aElectron -Beam- Specimen Interactions and Simulations Mthods in Microscopy
260 _aHoboken,
_bJohn Wiley &son, Inc,
_c2018.
300 _ax, 279p.: Ill.;figures & pictures.
_bIndex
_c23cm.
942 _2ddc
_cBKS
999 _c4421
_d4421