Electron -Beam- Specimen Interactions and Simulations Mthods in Microscopy

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Publication details: Hoboken, John Wiley &son, Inc, 2018.Description: x, 279p.: Ill.;figures & pictures. Index 23cmISBN:

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Books	College of Business Education Main Library General Collection				541.092 MEN (Browse shelf(Opens below))					Available			00000013181

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